I work with a system in which the microcontroller is exposed to X-ray radiation from time to time. Exactly how much radiation is hard to say... we've never measured it.
Anyway, we've seen a mysterious form of flash corruption on a small sample of our products in which random bits in code space are transitioning from 0 to 1.
We've previously attributed this to power supply issues and the controller not being reset quickly enough while data logging is going on.
But now we may be seeing it on a newer version of our product which has a higher end controller with better brown out protection.
Is it time to consider X-rays as a possible source?
The X-rays would be released due to breaking current high currents with a vacuum interrupter.
Has anyone ever heard of something like this before on nand-flash? Most of the articles I have seen have been with respect to Airport X-rays or X-ray inspection used in PCB FAB