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Specific noise terms are given in datasheets of MEMS sensors. In example the specification of accelerometer contains information about random walk and in some cases the bias instability.

  • Both quantities are determined by computing the allan varianz and allan deviation.
    The result of the allan deviation consists out of more noise terms than random walk and bias stability.

    • Why are only random walk and bias instability mentioned in datasheets?
    • Are those the terms that cause most noise?
      If yes why?
  • One more thing:
    Different noise errors are represented by different slopes of allan deviation.

  • Is it like a characteristic of allan deviation that different slopes occur after calculating a specific amount of overlapping clusters (groups of samples)?

Reference:

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